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95 lines
3.6 KiB
BibTeX
95 lines
3.6 KiB
BibTeX
@online{ wiki:IDE,
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author = "Wikipedia",
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title = "Integrierte Entwicklungsumgebung",
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year = "2018",
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url = "https://de.wikipedia.org/w/index.php?title=Integrierte_Entwicklungsumgebung&oldid=174180343",
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note = "[Online; Stand 14. März 2018]"
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}
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@online{ wiki:ARM,
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author = "Wikipedia",
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title = "ARM Limited",
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year = "2017",
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url = "https://de.wikipedia.org/w/index.php?title=ARM_Limited&oldid=172245346",
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note = "[Online; Stand 14. März 2018]"
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}
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@online{ techradar:ARM,
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author = "Dan Grabham",
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title = "From a small Acorn to 37 billion chips: ARM's ascent to tech superpower",
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url = "https://www.techradar.com/news/computing/from-a-small-acorn-to-37-billion-chips-arm-s-ascent-to-tech-superpower-1167034",
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month = "jul",
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year = "2013",
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note = "[Online; Stand 14. März 2018]"
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}
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@online{ wiki:Debugger,
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author = "Wikipedia",
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title = "Debugger",
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year = "2018",
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url = "https://de.wikipedia.org/w/index.php?title=Debugger&oldid=173107853",
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note = "[Online; Stand 14. März 2018]"
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}
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@online{ doku:tutorial,
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author = "Mieke, Andreas",
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title = "Keil $\mu$Vision 5 Tutorial",
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year = "2018",
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url = "https://git.1750studios.com/diploma-thesis/001_Keil_MDK5_Tutorial",
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note = "[Online; Stand 14. März 2018]"
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}
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@online{ arm:CMSIS,
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author = "{ARM Limited}",
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title = "Cortex Microcontroller Software Interface Standard",
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year = "2018",
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url = "https://developer.arm.com/embedded/cmsis",
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note = "[Online; Stand 14. März 2018]"
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}
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@ARTICLE{ ieee:1149-1,
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author = "",
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journal = "IEEE Std 1149.1-2013 (Revision of IEEE Std 1149.1-2001)",
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title = "IEEE Standard for Test Access Port and Boundary-Scan Architecture",
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year = "2013",
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volume = "",
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number = "",
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pages = "1-444",
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keywords = "IEEE standards;boundary scan testing;integrated circuit testing;printed circuit testing;IEEE Std 1149.1-2001 Revision;IEEE Std 1149.1-2013;IEEE standard;boundary scan architecture;boundary-scan register;component specific aspects;internal circuits test;printed circuit boards;standard interface;test access port;testability features;Boundary value problems;IEEE standards;Integrated circuits;Printed circuits;Testing;Very high speed integrated circuits;Boundary-Scan Description Language;Boundary-Scan Description Language (BSDL);IEEE 1149.1TM;Procedural Description Language (PDL);VHSIC Hardware Description Language (VHDL);boundary scan;boundary-scan architecture;boundary-scan boundary scan;boundary-scan register;circuit boards;circuitry;integrated circuit;printed circuit boards;test;test access port (TAP);very high speed integrated circuit (VHSIC)",
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doi = "10.1109/IEEESTD.2013.6515989",
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ISSN = "",
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month = "may"
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}
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@online{ wiki:Keil,
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author = "Wikipedia",
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title = "Keil (company)",
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year = "2018",
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url = "https://en.wikipedia.org/w/index.php?title=Keil_(company)&oldid=822646239",
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note = "[Online; Stand 15. März 2018]"
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}
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@online{ techdesignforums:ARM,
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author = "Edwards, Chris",
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title = "ARM and the man",
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year = "2016",
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month = "mar",
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url = "http://www.techdesignforums.com/practice/technique/arm-and-the-man/",
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note = "[Online; Stand 15. März 2018]"
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}
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@online{ wiki:C,
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author = "Wikipedia",
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title = "C (Programmiersprache)",
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year = "2018",
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url = "https://de.wikipedia.org/w/index.php?title=C_(Programmiersprache)&oldid=174856768",
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note = "[Online; Stand 15. März 2018]"
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}
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@online{ wiki:C++,
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author = "Wikipedia",
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title = "C++",
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year = "2018",
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url = "https://de.wikipedia.org/w/index.php?title=C%2B%2B&oldid=174161963",
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note = "[Online; Stand 15. März 2018]"
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} |